Distributionally Robust $k$-of-$n$ Sequential Testing
Rayen Tan, Viswanath Nagarajan

TL;DR
This paper introduces a distributionally robust approach to the $k$-of-$n$ sequential testing problem, providing approximation algorithms that account for uncertainty in test success probabilities to minimize worst-case expected testing costs.
Contribution
It develops the first distributionally-robust model for $k$-of-$n$ testing and offers approximation algorithms for non-adaptive solutions under uncertainty.
Findings
Achieves a 2-approximation for unit-cost tests.
Provides an $O(1/\sqrt{\epsilon})$-approximation for bounded uncertainty intervals.
Develops a quasi-polynomial time approximation scheme for the inner maximization problem.
Abstract
The -of- testing problem involves performing independent tests sequentially, in order to determine whether/not at least tests pass. The objective is to minimize the expected cost of testing. This is a fundamental and well-studied stochastic optimization problem. However, a key limitation of this model is that the success/failure probability of each test is assumed to be known precisely. In this paper, we relax this assumption and study a distributionally-robust model for -of- testing. In our setting, each test is associated with an interval that contains its (unknown) failure probability. The goal is to find a solution that minimizes the worst-case expected cost, where each test's probability is chosen from its interval. We focus on non-adaptive solutions, that are specified by a fixed permutation of the tests. When all test costs are unit, we obtain a…
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Taxonomy
TopicsComplexity and Algorithms in Graphs · Risk and Portfolio Optimization · Markov Chains and Monte Carlo Methods
