Probing Electromigration of Oxygen Vacancies in YBa$_2$Cu$_3$O$_{7-\delta}$ Devices by Multimodal X-ray Techniques
Caio C. Quaglio-Gomes, Stefan Marinkovi\'c, Elijah A. Abbey, Davi A. D. Chaves, Anna Palau, Alejandro V. Silhanek, Pedro Schio, and Maycon Motta

TL;DR
This study combines multiple advanced X-ray and optical techniques to investigate how electrical currents induce oxygen vacancy migration in YBCO superconductors, revealing structural and compositional changes crucial for device tuning.
Contribution
It provides a comprehensive multimodal analysis linking optical signatures with microscopic oxygen vacancy redistribution in YBCO under electromigration.
Findings
Oxygen depletion causes c-axis expansion in YBCO.
Optical contrast correlates with oxygen reordering profiles.
Surface deoxygenation is largely irreversible during electromigration.
Abstract
Control of oxygen vacancies by electrical currents in complex oxides such as YBaCuO (YBCO) has attracted considerable interest due to the relative simplicity of its implementation and its potential for both fundamental studies and the tuning of superconducting device properties. However, the structural evolution and depth-dependent effects associated with current-based techniques remain largely unexplored, particularly with respect to the connection between optical signatures and the spatial distribution of oxygen vacancies. Here, we combine nanoprobe X-ray Diffraction (NanoXRD), Cu K-edge X-ray Absorption Near-Edge Structure (XANES), X-ray Photoelectron Spectroscopy (XPS), electrical transport, and optical measurements to reveal modifications induced in YBCO microbridges by pulsed electromigration. We observe a c-axis expansion correlated with spectroscopic…
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Taxonomy
TopicsPhysics of Superconductivity and Magnetism · Copper Interconnects and Reliability · Semiconductor materials and devices
