Efficient Visual Anomaly Detection at the Edge: Enabling Real-Time Industrial Inspection on Resource-Constrained Devices
Arianna Stropeni, Fabrizio Genilotti, Francesco Borsatti, Manuel Barusco, Davide Dalle Pezze, Gian Antonio Susto

TL;DR
This paper introduces two efficient visual anomaly detection methods, PatchCore-Lite and Padim-Lite, optimized for resource-constrained edge devices to enable real-time industrial inspection with reduced memory and computation.
Contribution
The paper presents novel lightweight VAD algorithms tailored for edge deployment, significantly reducing memory and inference time compared to existing models.
Findings
PatchCore-Lite reduces memory footprint by 79%.
Padim-Lite decreases total memory by 77% and inference time by 31%.
Both methods are effective for real-time industrial inspection on edge devices.
Abstract
Visual Anomaly Detection (VAD) is essential for industrial quality control, enabling automatic defect detection in manufacturing. In real production lines, VAD systems must satisfy strict real-time and privacy requirements, necessitating a shift from cloud-based processing to local edge deployment. However, processing data locally on edge devices introduces new challenges because edge hardware has limited memory and computational resources. To overcome these limitations, we propose two efficient VAD methods designed for edge deployment: PatchCore-Lite and Padim-Lite, based on the popular PatchCore and PaDiM models. PatchCore-Lite runs first a coarse search on a product-quantized memory bank, then an exact search on a decoded subset. Padim-Lite is sped up using diagonal covariance, turning Mahalanobis distance into efficient element-wise computation. We evaluate our methods on the MVTec…
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Taxonomy
TopicsAnomaly Detection Techniques and Applications · Advanced Neural Network Applications · Industrial Vision Systems and Defect Detection
