Statistical Characteristic-Guided Denoising for Rapid High-Resolution Transmission Electron Microscopy Imaging
Hesong Li, Ziqi Wu, Ruiwen Shao, Ying Fu

TL;DR
This paper introduces a statistical characteristic-guided denoising network tailored for high-resolution transmission electron microscopy images, effectively reducing noise in rapid imaging scenarios to improve atomic observation.
Contribution
It proposes a novel denoising network guided by statistical characteristics in both spatial and frequency domains, specifically designed for HRTEM images, with a new noise calibration method and dataset.
Findings
Outperforms state-of-the-art denoising methods on synthetic and real HRTEM data.
Enhances localization accuracy in nucleation observation tasks.
Demonstrates robustness in noisy, rapid imaging conditions.
Abstract
High-Resolution Transmission Electron Microscopy (HRTEM) enables atomic-scale observation of nucleation dynamics, which boosts the studies of advanced solid materials. Nonetheless, due to the millisecond-scale rapid change of nucleation, it requires short-exposure rapid imaging, leading to severe noise that obscures atomic positions. In this work, we propose a statistical characteristic-guided denoising network, which utilizes statistical characteristics to guide the denoising process in both spatial and frequency domains. In the spatial domain, we present spatial deviation-guided weighting to select appropriate convolution operations for each spatial position based on deviation characteristic. In the frequency domain, we present frequency band-guided weighting to enhance signals and suppress noise based on band characteristics. We also develop an HRTEM-specific noise calibration method…
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Machine Learning in Materials Science
