Dopability limits in Al-rich AlGaN alloys for far-UVC LEDs
Ling Zhang, Miao Zhou, Alex M. Ganose

TL;DR
This study investigates the limits of doping in Al-rich AlGaN alloys for far-UVC LEDs, revealing how defects and impurities affect carrier injection and device performance, with implications for improving solid-state UV lighting technology.
Contribution
It provides a systematic analysis of intrinsic and extrinsic defects in high-Al-content AlGaN alloys, emphasizing the importance of alloy modeling and impurity effects on doping efficiency.
Findings
Si dopants form compensating DX centers in Al-rich environments.
Carbon is identified as the most detrimental unintentional impurity.
Explicit alloy modeling aligns calculations with experimental carrier concentrations.
Abstract
Transitioning to solid-state ultraviolet (UV) lighting is critical for reducing global energy utilization to meet net-zero targets. AlGaN-based far-UVC LEDs offer a mercury-free, energy-efficient alternative to conventional mercury lamps, yet their performance is severely bottlenecked by poor carrier injection at Al compositions exceeding 80\%. Point defects are known to significantly affect carrier concentrations and radiative recombination efficiency, however, systematic studies of point defects in AlGaN alloys remain scarce. In this work, we investigate intrinsic and extrinsic defects in high-Al-content AlGaN alloys ( = 1/6, 1/4, and 1/3). We reveal that explicit alloy modeling and proper treatment of the temperature dependence of the band gap are essential to bring calculated carrier concentrations in line with experimental observations. We uncover that Si dopants…
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Taxonomy
TopicsGaN-based semiconductor devices and materials · Ga2O3 and related materials · Photocathodes and Microchannel Plates
