DiscoRD: An Experimental Methodology for Quickly Discovering the Reliable Read Disturbance Threshold of Real DRAM Chips
Ataberk Olgun, F. Nisa Bostanci, Ismail Emir Yuksel, Haocong Luo, Minesh Patel, A. Giray Yaglikci, Onur Mutlu

TL;DR
DiscoRD introduces a rapid, empirical methodology for accurately measuring the read disturbance threshold in DRAM chips, enabling more secure and efficient mitigation strategies through detailed characterization and modeling.
Contribution
We develop a fast, reliable testing methodology for RDT in DRAM, supported by extensive experimental data and an empirical model for error probability analysis.
Findings
RDT varies significantly across DRAM rows.
Combining ECC, scrubbing, and run-time mitigation reduces errors.
DiscoRD enables precise, scalable RDT measurement for improved security.
Abstract
State-of-the-art DRAM read disturbance mitigations rely on the read disturbance threshold (RDT) (e.g., the number of aggressor row activations needed to induce the first read disturbance bitflip) to securely and performance- and energy-efficiently prevent read disturbance bitflips. However, accurately and exhaustively characterizing the RDT of every DRAM row in a chip is time intensive. Rapidly determining RDT is important for enabling secure, performance- and energy-efficient systems. Our goal is to develop and evaluate a reliable and rapid read disturbance testing methodology. To that end, we develop DiscoRD building on the key results of an extensive experimental characterization study using 212 real DDR4 chips whereby we measure the RDT of hundreds of thousands of DRAM rows millions of times. We develop an empirical model for read disturbance bitflips and evaluate the probability…
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Taxonomy
TopicsRadiation Effects in Electronics · Security and Verification in Computing · Physical Unclonable Functions (PUFs) and Hardware Security
