In-Situ Timing Diagnosis of PDN and Configuration-Upset-Induced Routing Delay Degradation in SRAM-based FPGAs
Mostafa Darvishi

TL;DR
This paper introduces a scalable, in-situ FPGA timing diagnosis system that differentiates between power network and routing-induced delays during normal operation, enabling better reliability and timing management.
Contribution
It presents a novel, non-intrusive architecture combining delay taps and statistical analysis for spatially-aware, real-time timing degradation diagnosis within FPGA fabric.
Findings
PDN-induced delays cause global, correlated shifts with minimal variance change.
Routing perturbations lead to localized delay increases and higher timing dispersion.
Distinct spatial signatures enable systematic differentiation of degradation mechanisms.
Abstract
Timing degradation in SRAM-based FPGAs arises from multiple physical mechanisms that manifest differently in the routing fabric, most notably power-distribution-network (PDN) marginality and configuration-induced routing perturbations. Existing in-situ timing monitors provide limited insight into the physical origin, spatial structure, or statistical characteristics of the degradation. This paper presents a scalable in-situ timing diagnosis architecture that enables fine-grained, routing-aware characterization of timing behavior directly within the FPGA fabric during normal operation. The proposed approach combines non-intrusive delay taps placed at routing switch-matrix boundaries with distributed phase-swept delay monitoring elements and centralized statistical analysis. By extracting probabilistic delay distributions rather than binary timing margins, the framework captures both mean…
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Taxonomy
TopicsLow-power high-performance VLSI design · VLSI and FPGA Design Techniques · Physical Unclonable Functions (PUFs) and Hardware Security
