First-principles identification of optically efficient erbium centers in GaAs
Khang Hoang

TL;DR
This study uses first-principles calculations to identify and analyze Er-related defect centers in GaAs, revealing their electronic properties and explaining the conditions for efficient Er luminescence in optoelectronic applications.
Contribution
It provides a detailed theoretical understanding of the formation and properties of Er centers in GaAs, especially the Er-2O defect, advancing knowledge of optically active Er centers in semiconductors.
Findings
Er-2O defect is identified as an efficient luminescent center.
Defects tend to trap electrons and facilitate nonradiative recombination.
Doping type influences defect formation and luminescence efficiency.
Abstract
Gallium arsenide (GaAs) doped with erbium (Er), a material of interest for optoelectronics and quantum information, has been studied for decades. Yet the formation of Er luminescence centers in the semiconductor host and their properties are still not well understood. Here we present a systematic investigation of Er-related defects in GaAs, including defect complexes consisting of Er and native point defects or oxygen impurities, using first-principles hybrid-functional defect calculations. We find that these defects have electronic structure and energetics that are generally asymmetric with respect to n- and p-type doping and tend to favor electron trapping. On the basis of the calculated defect levels, formation energies, and nonradiative carrier capture coefficients, we identify Er-related defect centers that are efficient as trap-assisted nonradiative recombination centers for…
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Taxonomy
TopicsSilicon Nanostructures and Photoluminescence · Semiconductor Quantum Structures and Devices · Silicon and Solar Cell Technologies
