Tracing the film structure of an organic semiconductor with photoemission orbital tomography
Monja Stettner, Siegfried Kaidisch, Andrey V. Matetskiy, Eric Fackelman, Serguei Soubatch, Christian Kumpf, Fran\c{c}ois C. Bocquet, Michael G. Ramsey, Peter Puschnig, F. Stefan Tautz

TL;DR
This study demonstrates that photoemission orbital tomography (POT) can effectively analyze the electronic and structural evolution of multilayer organic films, revealing layer-dependent changes in molecular arrangement and tilt angles.
Contribution
It extends POT application to multilayer organic films, providing detailed insights into structural changes with increasing layer thickness.
Findings
Intermolecular band periodicity varies with film thickness.
Molecular tilt angle decreases as layers increase.
Surface monolayer relaxes into bulk crystal structure.
Abstract
Photoemission orbital tomography (POT) is a powerful tool for investigating the orbitals and electronic band structure of oriented layers of organic molecules. In many cases, POT allows conclusions to be drawn regarding the geometric structure, but so far it has been mainly applied to (sub)monolayers and rarely to bilayers, raising the question of whether POT can also provide structure information for thicker films. Here, we use POT to analyze the band dispersion in up to eight layers of -sexithiophene (6T) adsorbed on Cu(110)-p()O. This linear oligomer turns out to be a textbook example that exemplifies the concepts of intra- and intermolecular band dispersion in molecules. Moreover, the rich band and orbital structure information available from POT for this system enables us to trace subtle changes in the crystal structure as a function of layer thickness.…
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Taxonomy
TopicsOrganic Electronics and Photovoltaics · Surface Chemistry and Catalysis · Transition Metal Oxide Nanomaterials
