Single-shot imaging with randomized structured illumination at a free electron laser

TL;DR

This paper demonstrates a new randomized probe imaging technique at a free electron laser, enabling robust single-shot nanoscale imaging of extended and scattering samples, including magnetic structures, with potential for studying fast dynamics.

Contribution

The implementation of randomized probe imaging at a free electron laser for single-shot, high-resolution imaging of complex samples, including magnetic domains, is a novel advancement.

Findings

Achieved 400 nm resolution over 40 μm field of view in a single shot.

Successfully imaged magnetic domain structures using circular dichroism.

Demonstrated robustness of the method for extended and scattering samples.

Abstract

Stroboscopic nanoscale imaging with free electron laser light is revolutionizing our understanding of fast dynamics in heterogeneous systems. The short wavelength of X-ray and extreme ultraviolet radiation makes it possible to achieve nanoscale resolution, while resonance with atomic transitions gives access to electronic and magnetic degrees of freedom. Here, we report on our implementation of a recently developed imaging method, randomized probe imaging, at a free electron laser. The advantage of randomized probe imaging over existing methods is its compatibility both with extended and strongly scattering samples. Our implementation delivers robust single-shot reconstructions at up to a full-pitch resolution of 400 nm over a field of view with a 40 {\mu}m diameter. We also demonstrate single-shot imaging of magnetic domain structures using circular dichroism at resonance, paving the way to future time-resolved studies of magnetic dynamics, shock physics, and the dynamics of collective electronic phases.