Kerr-induced Spectral Interferometry for Direct Ultra-sensitive Phase Recovery
Glitta R. Cheeran, Mehmet M\"uft\"uo\u{g}lu, Sobhi Saeed, Bennet Fischer, Mario Chemnitz

TL;DR
This paper presents a novel Kerr-induced spectral interferometry technique enabling direct, ultra-sensitive, reference-free phase measurements of optical pulses, improving robustness and scalability for optical imaging and communication.
Contribution
The authors introduce a new in-line phase retrieval method based on Kerr-mediated interference, eliminating the need for traditional interferometric setups and computationally intensive data processing.
Findings
Achieved phase sensitivity up to π/385.
Demonstrated shot-to-shot signal prominence at 13 dB above noise.
Operated at 80 MHz rates with 50 pJ pulse energies.
Abstract
Measuring the phase of light is fundamental to optical imaging, sensing, and signal processing applications. Conventional optical phase measurements rely on multipath configurations, bulky interferometric setups, and computationally intensive data pipelines, limiting scalability, robustness, and practicality. We introduce a technique that allows for reference-free in-line phase retrieval of abrupt phase transitions in optical pulses directly from spectral measurements. Theory, simulations, and experiments concurrently explain the effect as a result of a Kerr-mediated interference between a projected linear wave component and the high-intensity residual of the phase-altered pulse. Utilizing this phenomenon, we demonstrate algorithm-free phase measurements of up to {\pi}/385 sensitivity and shot-to-shot signal prominence at 13 dB above noise at 80 MHz rates and 50 pJ pulse energies. This…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsLaser-Matter Interactions and Applications · Advanced X-ray Imaging Techniques · Digital Holography and Microscopy
