Quantum Simulations for Extreme Ultraviolet Photolithography
Tyler D. Kharazi, Stepan Fomichev, Shu Kanno, Takao Kobayashi, Juan Miguel Arrazola, Qi Gao, Torin F. Stetina

TL;DR
This paper develops quantum simulation algorithms to accurately model high-energy photon interactions in EUV lithography, aiming to improve the resolution limits in semiconductor manufacturing.
Contribution
It introduces novel quantum algorithms for computing photoabsorption and photoelectron spectra at 92 eV, enabling more precise modeling of EUV lithography processes.
Findings
Quantum algorithms resolve photoabsorption cross-section at 92 eV.
Resource estimates show feasibility with ~200 qubits and 10^9 gates.
Modeling continuum states requires significantly higher computational resources.
Abstract
Extreme Ultraviolet (EUV) lithography is the state-of-the-art process in semiconductor fabrication, yet its spatial resolution is fundamentally limited by the ``blur'' originating from absorption of photons at 92 eV, which induce physical and chemical changes in the photoresist via excited state processes and electron cascades. Accurate modeling of these phenomena requires precise ab initio data for high-energy decay channels, specifically photoabsorption and photoelectron emission. These are computationally difficult for classical methods due to prohibitive scaling in simulating electron dynamics, or due to the inability to resolve the ionization continuum in an efficient manner. In this work, we present quantum simulation algorithms to compute these key observables. First, we introduce a coherent time-domain spectroscopy algorithm optimized to resolve the photoabsorption cross-section…
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Taxonomy
TopicsAdvancements in Photolithography Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
