The Contact Process Can Survive on a Slightly Subcritical Dynamical Percolation Cluster

TL;DR

This paper demonstrates that the contact process can survive on a slightly subcritical dynamical percolation cluster in dimensions two and higher, extending previous results from one dimension.

Contribution

It proves that for dimensions two and above, the contact process survives on a slightly subcritical dynamical percolation cluster, generalizing prior one-dimensional findings.

Findings

Survival of contact process on subcritical clusters for all update speeds

Extension of one-dimensional results to higher dimensions

Existence of a threshold p < pc(d) for survival

Abstract

The contact process on dynamic edges (CPDE) is a contact process evolving on a dynamic environment given by a dynamical percolation on the edges of Z d\,: each edge updates its state to open or closed with respective rates vp and v(1 -p). By coupling a well-chosen subset of once infected sites in the CPDE with a cluster of some supercritical percolation on the edges of Z d , we prove that, for every dimension d $\ge$ 2, we can find some slightly subcritical p < pc(d) such that for every update speed v > 0, the contact process with large enough infection rate can survive. This extends the result for dimension 1 proved by Linker and Remenik in [LR20].