Twist-induced Out-of-plane Ferroelectricity in Bilayer Hafnia
Jian Huang, Gwan Yeong Jung, Pravan Omprakash, Guodong Ren, Xin Li, Du Li, Xiaoshan Xu, Li Yang, Rohan Mishra

TL;DR
This paper predicts that twisting bilayer 1T-HfO2 induces stable out-of-plane ferroelectricity through symmetry breaking, enabling switchable polarization suitable for ultra-thin memory devices.
Contribution
It introduces a novel mechanism for out-of-plane ferroelectricity in bilayer hafnia via twisting, supported by first-principles calculations, expanding the potential for 2D ferroelectric materials.
Findings
Twisted bilayer 1T-HfO2 exhibits ~16 μC/cm² polarization.
Polarization can be reversibly switched with low energy barrier (~8 meV).
The system offers electric-field tunability and scalability for memory applications.
Abstract
Ferroelectric HfO2 is a promising candidate for next-generation memory devices due to its CMOS compatibility and ability to retain polarization at nanometer scales. However, the polar orthorhombic phase (Pca2_1) responsible for ferroelectricity is metastable and requires extrinsic stabilization, which makes it challenging for integration with silicon. We predict that bilayer 1T-HfO2 can exhibit robust and switchable out-of-plane (OOP) polarization arising from stacking-induced symmetry breaking. Using first-principles density functional theory, we predict that monolayer 1T-HfO2 can be cleaved from the (111) surface of cubic hafnia, and the monolayer is dynamically stable. When two aligned monolayers are twisted to form a moir\'e superlattice, it breaks the interlayer symmetry and allows the emergence of bistable OOP polarization. At a twist angle of 7.34o, the system exhibits a net…
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Taxonomy
TopicsFerroelectric and Negative Capacitance Devices · Semiconductor materials and devices · Ferroelectric and Piezoelectric Materials
