The Refractive Index of Gallium Antimonide
Ulrich Galander, Nicolas Huwyler, Mirela Encheva, Matthias Golling, Oliver H. Heckl

TL;DR
This paper provides highly accurate measurements of the complex refractive index of gallium antimonide (GaSb) in the near- to mid-infrared range, crucial for improving photonic device design and simulation.
Contribution
It introduces a precise measurement method for GaSb's refractive index with quantified uncertainties, enhancing reliability over previous theoretical or less accurate experimental data.
Findings
Measured $n_{GaSb}$ with <7.8e-5 relative uncertainty
Measured $k_{GaSb}$ with <2.0e-3 relative uncertainty
Reported $n_{AlAsSb}$ with <3.9e-4 relative uncertainty
Abstract
Gallium antimonide (GaSb) is a key material for near- and mid-infrared photonics, enabling high-performance laser architectures and detectors. Design and simulation of such devices depend on accurate optical material data, especially the complex refractive index , consisting of the real part (refractive index) and the imaginary part (extinction coefficient). However, GaSb refractive index values are based either on theoretical models, typically informed by legacy experimental data, or on experimental measurements without quantified uncertainties. This limits their reliability for state-of-the-art devices. Here, we present measurement results of in the near- to mid-infrared range from \SIrange{1}{3.1}{\micro \metre} with a relative uncertainty <\num{7.8e-5} for…
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Taxonomy
TopicsSemiconductor Quantum Structures and Devices · Advanced Semiconductor Detectors and Materials · GaN-based semiconductor devices and materials
