Scalable Solar-Blind Imaging Enabled by Single-Crystalline Beta-Ga2O3 Membranes on Silicon Backplanes
Xiang Xu (1, 2, 8), Hong Huang (3, 8), Qi Huang (6, 8), Hao Wang (2, 8), Huaze Zhu (2), Junwei Cao (1, 2), Zheng Zhu (7), Yaqin Ma (1, 2), Yiyang Xu (1, 2), Zhongfang Zhang (4), Yitong Chen (4), Ke Chen (7), Tong Jiang (2, 4), Bowen Zhu (4, 5, 6), Xiaolong Zhao (3)

TL;DR
This paper presents a novel membrane-based integration platform using single-crystalline beta-Ga2O3 for scalable, high-resolution solar-blind UV imaging on silicon backplanes, overcoming material and system-level constraints.
Contribution
It introduces a membrane assembly strategy that enables high-resolution UV detector arrays on silicon, improving system speed and compatibility with existing electronics.
Findings
Wafer-scale freestanding beta-Ga2O3 membranes achieved
High-speed, non-persistent UV photodiodes demonstrated
Uniform solar-blind imaging arrays without lag
Abstract
Ultrawide-bandgap semiconductors are attractive for solar-blind ultraviolet (UV) detection owing to their intrinsically low noise and high spectral selectivity, yet their deployment in large-area, high-density electronic imaging systems remains limited by a fundamental trade-off between material quality, device speed, and compatibility with high-density planar silicon readout circuits. Here, we report a membrane-enabled integration platform based on transferable single-crystalline beta-Ga2O3 that overcomes these constraints at the system level. By exploiting the weak interplanar bonding of beta-Ga2O3 (100) plane, we obtain wafer-scale freestanding single-crystalline membranes that enable vertically integrated photodiodes with sub-microsecond, non-persistent photoresponse and high UV-visible rejection. Crucially, we introduce a stitching-based membrane assembly strategy that decouples…
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Taxonomy
TopicsGa2O3 and related materials · Advanced Photocatalysis Techniques · Silicon Nanostructures and Photoluminescence
