X-ray reflection: a FLUKA model and its application in the design of synchrotron light beamlines and CERN's Future Circular Collider
Giuseppe Mazzola, Sunil Chitra, Arnaud Devienne, Alessandro Frasca, Mar\'ia Jos\'e Garc\'ia Fust\'e, Dominique Heinis, Anton Lechner, Giuseppe Lerner, Luca Rebuffi, Manuel Sanchez del Rio, David L. Windt, Eugeni Graug\'es, Francesc Salvat Pujol

TL;DR
This paper introduces a new FLUKA model for x-ray reflectivity that considers energy, angle, polarization, and surface roughness, enabling comprehensive synchrotron radiation simulations in a single framework.
Contribution
A novel FLUKA reflectivity model that accurately simulates x-ray reflection on solid surfaces, integrating it into a unified simulation workflow for synchrotron and collider applications.
Findings
FLUKA reflectivity results agree with state-of-the-art codes.
The model enables simulation of complex optical systems in FLUKA.
Application examples demonstrate practical use in beamline design and collider environments.
Abstract
Relying on atomic scattering factors from evaluated databases, a new model for the reflectivity of x rays on solid surfaces has been developed for FLUKA v4-6.0. This model accounts for the variation of reflectivity as a function of the photon energy, its incidence angle, and linear polarisation; surface roughness effects are also taken into account. FLUKA reflectivities agree well with those obtained from state-of-the-art codes used for the characterization of optical devices, both for homogeneous solids and for multilayer mirrors. This new capability renders FLUKA a nearly one-stop shop for synchrotron radiation simulations: emission from bending magnets and wigglers, photon transport and interaction, electromagnetic (and hadronic when applicable) shower development in complex geometries, as well as x-ray reflection at designated solid surfaces can now be all accounted for in a single…
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Taxonomy
TopicsParticle Accelerators and Free-Electron Lasers · Particle Detector Development and Performance · Crystallography and Radiation Phenomena
