Systematic Analysis of Ferroelectric Domain Dynamics in Periodically Poled Lithium Niobate Waveguides Using Two-Photon Microscopy and Digital Imaging Processing

TL;DR

This paper introduces a scalable, non-destructive two-photon microscopy method with image processing for characterizing and optimizing periodically poled lithium niobate devices, aiding wafer-level fabrication and integration.

Contribution

It presents a novel, image-based analysis workflow for large-scale, non-destructive evaluation of PPLN devices, linking structural parameters with fabrication conditions.

Findings

Enables direct extraction of domain parameters from microscopy images

Correlates poling conditions with structural quality metrics

Supports wafer-level process development and device integration

Abstract

We present a characterization and analysis methodology suitable for volume production for characterizing and optimizing x-cut thin-film periodically poled lithium niobate (PPLN) devices using two-photon (2P) microscopy with quantitative image processing. This method enables direct extraction of key structural parameters, such as duty cycle, phase-matching behavior, and domain uniformity, across large device sets in a non-destructive manner. By correlating 2P microscopy-derived structural metrics with systematic variations in poling conditions, we establish a scalable, image-driven approach for evaluating and improving PPLN fabrication. The resulting workflow supports wafer-level process development and accelerates the manufacturing and packaging of lithium niobate photonic integrated circuits (PICs).