A Multiscale Workflow for Thermal Analysis of 3DI Chip Stacks
Max Bloomfield, Amogh Wasti, Zongmin Yang, Matthew Galarza, Theodorian Borca-Tasciuc, Jacob Merson, Timothy Chainer, Prabudhya Roy Chowdhury, Aakrati Jain

TL;DR
This paper introduces a multiscale finite-element methodology for fast, accurate thermal analysis of 3D chip stacks, capturing detailed phenomena in complex, multi-material systems for improved thermal management.
Contribution
The paper presents a hierarchical multiscale FEM approach that automates the construction of RVE models for thermal homogenization in 3D integrated circuit stacks.
Findings
Enables die-scale thermal simulations with detailed BEOL features.
Uses automated RVE construction from industry layout files.
Achieves efficient and accurate thermal analysis for complex chip stacks.
Abstract
Thermally aware design of 2.5D and 3D advanced packaging systems will require fast, accurate, and powerful thermal analysis of chiplets, stacks, and packages. These systems contain multiple materials with non-linear heat transfer properties and geometric feature sizes that span many orders of magnitude. The smallest heterostructures in the front and back ends of the line present significant thermal modeling and analysis challenges in isolation. Replicated millions or billions of times in a chiplet stack, these structures present a near insurmountable hurdle to meeting the speed and accuracy needed of analysis in the design process. Additionally, establishing precise parameter values for the materials in these systems, when size and temperature dependencies create significant deviations from bulk properties, further complicates the problem. To address these issues, we have developed a…
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Taxonomy
Topics3D IC and TSV technologies · Composite Material Mechanics · Electronic Packaging and Soldering Technologies
