COFFEE: A Carbon-Modeling and Optimization Framework for HZO-based FeFET eNVMs
Hongbang Wu, Xuesi Chen, Shubham Jadhav, Amit Lal, Lillian Pentecost, Udit Gupta

TL;DR
This paper introduces COFFEE, a comprehensive framework for modeling and optimizing the environmental impact of HZO-based FeFET eNVMs throughout their life cycle, including manufacturing and operation, to promote sustainable computing.
Contribution
It presents the first carbon modeling framework for HZO-based FeFET eNVMs, integrating embodied and operational carbon assessments with design space exploration tools.
Findings
HZO-FeFETs have up to 11% higher embodied carbon per unit area than CMOS baseline.
HZO-FeFETs offer about 4.3x lower embodied carbon per MB than SRAM.
Replacing SRAM with HZO-FeFETs in an edge ML accelerator reduces embodied carbon by 42.3% and operational carbon by 70%.
Abstract
Information and communication technologies account for a growing portion of global environmental impacts. While emerging technologies, such as emerging non-volatile memories (eNVM), offer a promising solution to energy efficient computing, their end-to-end footprint is not well understood. Understanding the environmental impact of hardware systems over their life cycle is the first step to realizing sustainable computing. This work conducts a detailed study of one example eNVM device: hafnium-zirconium-oxide (HZO)-based ferroelectric field-effect transistors (FeFETs). We present COFFEE, the first carbon modeling framework for HZO-based FeFET eNVMs across life cycle, from hardware manufacturing (embodied carbon) to use (operational carbon). COFFEE builds on data gathered from a real semiconductor fab and device fabrication recipes to estimate embodied carbon, and architecture level eNVM…
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Taxonomy
TopicsFerroelectric and Negative Capacitance Devices · Advanced Sensor and Energy Harvesting Materials · Advancements in Semiconductor Devices and Circuit Design
