Enhanced selfphase modulation in silicon nitride waveguides with integrated 2D MoS2 films
Shahaz S. Hameed, Di Jin, Aihao Zhao, Jiayang Wu, Junkai Hu, Sebastien Cueff, Christian Grillet, Yuning Zhang, Irfan H. Abidi, Sumeet Walia, Christelle Monat, and David J. Moss

TL;DR
This paper demonstrates significantly enhanced self-phase modulation in silicon nitride waveguides integrated with monolayer MoS2 films, leading to increased spectral broadening and nonlinear optical performance at telecom wavelengths.
Contribution
It introduces a method to integrate 2D MoS2 films onto Si3N4 waveguides, achieving up to 27-fold increase in nonlinear parameter and enhanced spectral broadening.
Findings
Spectral broadening factor of up to 2.4 observed
Nonlinear parameter increased by up to 27 times
Kerr coefficient of MoS2 is nearly 5 orders of magnitude higher
Abstract
On-chip integration of 2D materials provides a promising route towards next-generation integrated optical devices with performance beyond existing limits. Here, significantly enhanced spectral broadening induced by self-phase modulation (SPM) is experimentally demonstrated in silicon nitride (Si3N4) waveguides integrated with 2D monolayer molybdenum disulfide (MoS2) films. Monolayer MoS2 films with ultrahigh optical nonlinearity are synthesized via low-pressure chemical vapor deposition (LPCVD) and subsequently transferred onto Si3N4 waveguides, with precise control of the film coating length and placement achieved by selectively opening windows on the chip silica upper cladding. Detailed SPM measurements at telecom wavelengths are performed using fabricated waveguides with various MoS2 film coating lengths. Compared to devices without MoS2, increased spectral broadening of…
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Taxonomy
TopicsAdvanced Fiber Laser Technologies · Photonic and Optical Devices · 2D Materials and Applications
