Residual neural-field ptychography for dose-efficient electron, X-ray, and optical nanoscopy
Qianhao Zhao, Zhixuan Hong, Ruihai Wang, Tianbo Wang, Lingzhi Jiang, Qiong Ma, Peng-Han Lu, Rafal E. Dunin-Borkowski, Andrew Maiden, and Guoan Zheng

TL;DR
This paper introduces a novel neural network framework for ptychography that improves convergence, reduces data redundancy, and achieves high-resolution imaging across electron, X-ray, and optical modalities by integrating physical models and residual learning.
Contribution
The authors propose a self-correcting residual neural-field approach with a complex-valued architecture and embedded physical models, enabling dose-efficient, high-resolution nanoscopy with joint parameter correction.
Findings
Achieved 244-nm resolution with visible light ptychography.
Demonstrated superior performance in electron microscopy of brain tissue.
Validated across various ptychography modalities including Fourier and coded ptychography.
Abstract
Ptychography spans from sub-angstrom to meter scales yet suffers from convergence instability and excessive data redundancy. Here we introduce self-correcting residual neural fields as a dose-efficient framework for electron, X-ray, and optical ptychography. Unlike approaches that split complex fields, our complex-valued architecture employs holomorphic phasor activation e^i{\omega}z to preserve intrinsic phase-amplitude coupling. We reformulate reconstruction as residual learning, where the network learns only corrections to physical priors rather than complete wavefields. By embedding the physical model as a differentiable layer within the network, we enable end-to-end automatic differentiation where experimental parameters are jointly corrected alongside the neural fields. We validate our scheme across conventional, near-field, coded, and Fourier ptychography and achieve…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Crystallography and Radiation Phenomena
