Controlling Mixed Mo/MoS$_2$ Domains on Si by Molecular Beam Epitaxy for the Hydrogen Evolution Reaction
Eunseo Jeon, Vincent Masika Peheliwa, Marie Hr\r{u}zov\'a Kratochv\'ilov\'a, Tim Verhagen, Yong-Kul Lee

TL;DR
This study demonstrates how molecular beam epitaxy parameters can be tuned to optimize the structural, electronic, and catalytic properties of MoS$_2$ thin films for enhanced hydrogen evolution reaction performance.
Contribution
It introduces a systematic MBE growth approach to control MoS$_2$ properties, revealing defect engineering as key to improving catalytic activity.
Findings
Defect-engineered MoS$_2$ films achieve low overpotentials (-0.33 V) for HER.
Intermediate growth conditions produce MoS$_2$ with active basal planes and high conductivity.
Optimized films show doubled turnover frequencies compared to stoichiometric counterparts.
Abstract
Molybdenum disulfide (MoS) is a prototypical layered transition-metal dichalcogenide whose electrocatalytic performance is governed by a delicate balance between crystallinity, defect density, and electronic conductivity. Here we report a systematic molecular beam epitaxy (MBE) study in which annealing temperature, deposition cycle number, and Mo/S thickness ratio were independently varied to control the structural and electronic properties of MoS thin films. The successful epitaxial growth of atomically uniform MoS directly on Si substrates enables strong interfacial coupling and efficient charge transfer, offering a viable route toward semiconductor-integrated catalytic architectures. X-ray diffraction, Raman spectroscopy, and X-ray absorption analyses reveal that higher annealing temperatures and excessive deposition cycles enhance crystallinity but reduce edge-site…
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