Machine Failure Detection Based on Projected Quantum Models
Larry Bowden, Qi Chu, Bernard Cena, Kentaro Ohno, Bob Parney, Deepak Sharma, Mitsuharu Takeori

TL;DR
This paper presents a novel quantum computing-based failure detection algorithm that uses projected quantum feature maps and change-point detection to identify anomalies in industrial machine data, validated on real and benchmark datasets.
Contribution
It introduces a new quantum-enhanced failure detection method utilizing projected quantum feature maps and demonstrates its practical implementation on a 133-qubit quantum processor.
Findings
Effective anomaly detection in noisy time series data
Successful implementation on IBM's quantum hardware
Improved precision over classical methods
Abstract
Detecting machine failures promptly is of utmost importance in industry for maintaining efficiency and minimizing downtime. This paper introduces a failure detection algorithm based on quantum computing and a statistical change-point detection approach. Our method leverages the potential of projected quantum feature maps to enhance the precision of anomaly detection in machine monitoring systems. We empirically validate our approach on benchmark multi-dimensional time series datasets as well as on a real-world dataset comprising IoT sensor readings from operational machines, ensuring the practical relevance of our study. The algorithm was executed on IBM's 133-qubit Heron quantum processor, demonstrating the feasibility of integrating quantum computing into industrial maintenance procedures. The presented results underscore the effectiveness of our quantum-based failure detection…
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Taxonomy
TopicsQuantum Computing Algorithms and Architecture · Quantum Information and Cryptography · Radiation Effects in Electronics
