Dynamic Multiband Microscopy: A Universal Paradigm for Quantitative Nanoscale Metrology

TL;DR

Dynamic Multiband Microscopy (DMM) introduces a universal, high-fidelity nanoscale metrology framework combining multifrequency excitation and continuous frequency sweeping, overcoming limitations of existing SPM techniques.

Contribution

The paper presents DMM, a novel approach that enhances SPM by integrating multifrequency excitation with continuous sweeping, enabling autonomous, high-resolution nanoscale measurements.

Findings

Validated on ferroelectric nanofibers with high accuracy

Achieved simultaneous 3D polarization mapping without crosstalk

Reaches fundamental noise and spectral sensitivity limits

Abstract

Scanning Probe Microscopy (SPM) is the primary tool for exploring nanoscale functionality, yet standard single-frequency operation is fundamentally limited, because the dynamic tip-sample interaction is mathematically underdetermined. While advanced methods such as Dual Amplitude Resonance Tracking (DART) and Band Excitation (BE) address this by tracking resonance, they face critical limitations: DART suffers from feedback instability on complex topographies, while Band Excitation is constrained by severe trade-offs between spectral resolution and acquisition speed. Here, we introduce Dynamic Multiband Microscopy (DMM), a general framework that bridges these gaps by combining multifrequency excitation with continuous frequency sweeping. We implement this within an automated experimental workflow that autonomously identifies and targets measurement points of interest. In combination with quantitative interferometric detection, this approach brings SPM to the fundamental limits of noise and spectral sensitivity. Validated on ferroelectric nanofibers, this platform enables simultaneous, crosstalk-free 3D polarization mapping, establishing a universal framework for autonomous, high-fidelity nanoscale metrology.