Layer Decoupling in Twisted Bilayer WSe$_2$ Uncovered by Automated Dark-Field Tomography
A. Nakamura, Y. Chiashi, T. Shimojima, Y. Tanaka, S. Akatsuka, M. Sakano, S. Masubuchi, T. Machida, K. Watanabe, T. Taniguchi, and K. Ishizaka

TL;DR
This paper introduces an automated dark-field electron tomography technique to analyze the 3D atomic structure of twisted bilayer WSe$_2$, revealing interlayer expansion, temperature-driven decoupling, and ultrafast optically induced separation, advancing understanding of moiré materials.
Contribution
The study presents a novel 3D structural analysis method for atomically thin materials, providing new insights into interlayer spacing and dynamics in twisted bilayer WSe$_2$.
Findings
Interlayer spacing exceeds 0.1 angstrom compared to bulk
Temperature induces interlayer decoupling unique to twisted bilayers
Optical excitation causes ~0.2 angstrom separation on picosecond timescale
Abstract
Twisted bilayer systems host a wealth of emergent phenomena, such as flat-band superconductivity, ferromagnetism, and ferroelectricity, arising from moir\'e superlattices and unconventional interlayer coupling. Despite their central role, direct and quantitative access to the out-of-plane atomic structure in these systems has remained elusive due to their nanoscale dimensions. Here, we introduce an automated dark-field electron tomography technique that enables three-dimensional structural analysis of atomically thin materials with sub-angstrom precision. Applying this method to twisted bilayer WSe, we uncover a significant expansion of the interlayer spacing compared to the bulk configuration, exceeding 0.1 angstrom, along with a remarkable temperature-driven interlayer decoupling unique to the twisted bilayer. Ultrafast measurement further reveals optically induced interlayer…
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Taxonomy
Topics2D Materials and Applications · Chemical and Physical Properties of Materials · Topological Materials and Phenomena
