Topology-Directed Silicide Formation: An Explanation for the Growth of C49-TiSi$_2$ on the Si(100) Surface
Lukas H\"uckmann, Jonathon Cottom, J\"org Meyer, Emilia Olsson

TL;DR
This study uses DFT calculations to model Ti adsorption on Si(100), revealing how surface topology influences the nucleation of the metastable C49-TiSi$_2$ phase, explaining its growth despite thermodynamic preferences.
Contribution
It provides a detailed atomistic model linking surface topology and TiSi$_2$ polymorph formation, advancing understanding of growth mechanisms on Si(100).
Findings
Explains the preferential formation of C49-TiSi$_2$ on Si(100).
Rationalizes the growth mode and surface disruption effects.
Highlights the role of surface symmetry and Ti adsorption patterns.
Abstract
Designing metal-semiconductor junctions is essential for optimizing the performance of modern nanoelectronic devices. A widely used material is TiSi, which combines low electronic resistivity with good endurance. However, its multitude of polymorphs continues to pose a challenge for device fabrication. In particular, the naturally occurring formation of the metastable C49-TiSi modification remains poorly understood and is problematic due to its unfavorable electronic properties. Based on extensive DFT calculations, we present a comprehensive model of Ti adsorption on Si(100) that highlights the pivotal role of surface topology for the initial stages of the interfacial TiSi formation process. We show that the interplay between Si surface dimers, the symmetry of the Si(100) surface, and the incorporation of Ti adsorbates below the surface drives an adsorption pattern that…
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Taxonomy
TopicsSemiconductor materials and interfaces · Nanowire Synthesis and Applications · Chemical and Physical Properties of Materials
