Knowledge-Embedded and Hypernetwork-Guided Few-Shot Substation Meter Defect Image Generation Method

TL;DR

This paper introduces a novel framework combining knowledge embedding and hypernetwork guidance within a stable diffusion model to generate realistic, controllable substation meter defect images from limited data, improving defect detection performance.

Contribution

It presents a new method integrating knowledge embedding, geometric defect modeling, and hypernetworks for few-shot defect image synthesis in industrial settings.

Findings

Reduces FID by 32.7% compared to baselines

Increases defect detector mAP by 15.3% with augmented data

Outperforms existing data augmentation methods

Abstract

Substation meters play a critical role in monitoring and ensuring the stable operation of power grids, yet their detection of cracks and other physical defects is often hampered by a severe scarcity of annotated samples. To address this few-shot generation challenge, we propose a novel framework that integrates Knowledge Embedding and Hypernetwork-Guided Conditional Control into a Stable Diffusion pipeline, enabling realistic and controllable synthesis of defect images from limited data. First, we bridge the substantial domain gap between natural-image pre-trained models and industrial equipment by fine-tuning a Stable Diffusion backbone using DreamBooth-style knowledge embedding. This process encodes the unique structural and textural priors of substation meters, ensuring generated images retain authentic meter characteristics. Second, we introduce a geometric crack modeling module that parameterizes defect attributes--such as location, length, curvature, and branching pattern--to produce spatially constrained control maps. These maps provide precise, pixel-level guidance during generation. Third, we design a lightweight hypernetwork that dynamically modulates the denoising process of the diffusion model in response to the control maps and high-level defect descriptors, achieving a flexible balance between generation fidelity and controllability. Extensive experiments on a real-world substation meter dataset demonstrate that our method substantially outperforms existing augmentation and generation baselines. It reduces Frechet Inception Distance (FID) by 32.7%, increases diversity metrics, and--most importantly--boosts the mAP of a downstream defect detector by 15.3% when trained on augmented data. The framework offers a practical, high-quality data synthesis solution for industrial inspection systems where defect samples are rare.