Physics-embedded neural computational electron microscopy for quantitative 4D nanometrology
Hao-Jin Wang, Liqun Shen, Xin-Ning Tian, Lei Lei, Kexin Wang, Grigore Moldovan, Marc-Georg Willinger, Zhu-Jun Wang

TL;DR
This paper introduces a physics-embedded neural microscopy framework that enables high-throughput, quantitative 3D nanometrology and dynamic in situ characterization by integrating physical models with deep learning, surpassing traditional electron microscopy limits.
Contribution
The work presents a novel end-to-end neural microscopy approach combining a differentiable physical model with deep learning, enabling accurate 3D and 4D nanoscale imaging with high speed and physical consistency.
Findings
Achieves atomic-force-microscopy-level precision in 3D nanometrology.
Enables real-time 4D in situ surface nanostructure tracking.
Establishes a generalizable approach for solving ill-posed inverse problems.
Abstract
The fusion of rigorous physical laws with flexible data-driven learning represents a new frontier in scientific simulation, yet bridging the gap between physical interpretability and computational efficiency remains a grand challenge. In electron microscopy, this divide limits the ability to quantify three-dimensional topography from two-dimensional projections, fundamentally constraining our understanding of nanoscale structure-function relationships. Here, we present a physics-embedded neural computational microscopy framework that achieves metrological three-dimensional reconstruction by deeply coupling a differentiable electron-optical forward model with deep learning. By introducing a Vision Field Transformer as a high-speed, differentiable surrogate for physical process analysis simulations, we establish an end-to-end, self-supervised optimization loop that enforces strict…
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Machine Learning in Materials Science · Model Reduction and Neural Networks
