Percolation-Driven Magnetotransport due to Structural and Microstructural Evolution in Ultrathin Si/Fe Bilayers
S. S. Das, M. Senthil Kumar

TL;DR
This study investigates how microstructural evolution near the percolation threshold in ultrathin Si/Fe bilayers influences magnetotransport and the anomalous Hall effect, revealing a transition from continuous to percolative structures and a change in AHE mechanisms.
Contribution
It provides a comprehensive analysis linking microstructure, magnetism, and transport in ultrathin magnetic heterostructures, highlighting a percolation-driven transition and AHE mechanism crossover.
Findings
Percolation transition occurs below 30 Å Fe thickness.
AHE mechanism shifts from intrinsic/side-jump to skew scattering.
Critical exponent consistent with 2D-disordered systems.
Abstract
The anomalous Hall effect (AHE) in magnetic nanofilms is highly sensitive to the microstructural and magnetic homogeneity. However, the evolution of the microstructure and morphology near the percolation threshold, and its connection to the resulting magnetic and magnetotransport behavior in low-dimensional magnetic heterostructures, remain poorly understood. In this study, we present a comprehensive analysis of the evolution of the structural, microstructural, and magnetotransport properties of Si/Fe bilayers by varying the Fe layer thickness. X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and magnetisation data reveal a percolation-driven transition from a continuous metallic film to percolative network structure of grains when tFe decreases below 30 Angstrom. Transport measurements involving longitudinal resistivity (rho), and the anomalous Hall…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsZnO doping and properties · Semiconductor materials and interfaces · Magnetic properties of thin films
