Sizes of Ferroelectricity Appearance and Disappearence in Nanosized Hafnia-Zirconia:Landau-type Theory
Anna N. Morozovska, Eugene A. Eliseev, Sergei V. Kalinin, and Maksym V. Strikha

TL;DR
This paper analytically investigates the critical sizes for the appearance and disappearance of ferroelectricity in nanosized hafnia-zirconia thin films, considering strain effects and phase stability.
Contribution
It introduces analytical expressions for critical sizes in hafnia-zirconia, incorporating strain effects and phase diagram analysis, advancing understanding of nanoscale ferroelectricity.
Findings
Critical thickness for ferroelectricity disappearance depends on depolarization and correlation effects.
Critical size for ferroelectricity appearance depends on mismatch strain and strain relaxation mechanisms.
Analytical formulas can be applied to HfxZr1-xO2 solid solutions with known parameters.
Abstract
Nanosized hafnia-zirconia HfxZr1-xO2 in the form of thin films, multilayers and heterostructures are indispensable silicon-compatible ferroelectric materials for advanced electronic memories and logic devices. The distinctive feature of nanoscale hafnia-zirconia are the critical sizes of ferroelectricity appearance, whereas the critical sizes of ferroelectricity disappearance exist in other ferroelectrics. Using the Landau-Ginzburg-Devonshire free energy functional with higher powers, trilinear and biquadratic couplings of polar, nonpolar and antipolar order parameters, we calculated analytically the strain-dependent critical sizes of the ferroelectricity appearance and disappearance, analyzed how the size effect and mismatch strains influence the phase diagrams and polarization switching barrier in epitaxial HfO2 thin films and nano-islands with the out-of-plane spontaneous…
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