Analysis of the Optical Properties and Electronic Structure of Semiconductors of the Cu2NiXS4 (X = Si, Ge, Sn) Family as New Promising Materials for Optoelectronic Devices
Dilshod Nematov

TL;DR
This study uses first-principles calculations to analyze the electronic and optical properties of Cu2NiXS4 semiconductors, revealing how substituting X elements affects band gaps and optical behavior, with implications for optoelectronic device applications.
Contribution
It provides a detailed computational analysis of Cu2NiXS4 materials, highlighting the effects of X element substitution on electronic structure and optical properties, which was not previously explored.
Findings
Band gap decreases from 2.58 eV to 1.33 eV with Ge and Sn substitution
Good agreement between HSE06 calculations and experimental data
Changes in dielectric constant and optical conductivity depend on photon energy
Abstract
In this work, the optoelectronic characteristics of kesterites of the Cu2NiXS4 system (X = Si, Ge, Sn) were studied. The electronic properties of the Cu2NiXS4 (X = Si, Ge, Sn) system were studied using first-principles calculations within the framework of density functional theory. For calculations, ab initio codes VASP and Wien2k were used. The high-precision modified Beke-Jones (mBJ) functional and the hybrid HSE06 functional were used to estimate the bandgap, electronic and optical properties. Calculations have shown that when replacing Si with Ge and Sn, the band gap decreases from 2.58 eV to 1.33 eV. Replacing Si with Ge and Sn reduces the overall density of electronic states. In addition, new deep (shallow) states are formed in the band gap of these crystals, which is confirmed by the behavior of their optical properties. The obtained band gap values are compared with existing…
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Taxonomy
TopicsChalcogenide Semiconductor Thin Films · Copper-based nanomaterials and applications · Semiconductor materials and interfaces
