Pat-DEVAL: Chain-of-Legal-Thought Evaluation for Patent Description
Yongmin Yoo, Kris W Pan

TL;DR
Pat-DEVAL is a novel multi-dimensional evaluation framework that uses a Chain-of-Legal-Thought reasoning process with large language models to assess patent descriptions for technical coherence and legal compliance.
Contribution
It introduces the first legally-constrained, multi-dimensional evaluation method for patent descriptions, significantly improving assessment accuracy over existing metrics.
Findings
Achieves a Pearson correlation of 0.69 with expert judgments.
Demonstrates a correlation of 0.73 in legal compliance evaluation.
Outperforms baseline metrics and existing LLM evaluators.
Abstract
Patent descriptions must deliver comprehensive technical disclosure while meeting strict legal standards such as enablement and written description requirements. Although large language models have enabled end-to-end automated patent drafting, existing evaluation approaches fail to assess long-form structural coherence and statutory compliance specific to descriptions. We propose Pat-DEVAL, the first multi-dimensional evaluation framework dedicated to patent description bodies. Leveraging the LLM-as-a-judge paradigm, Pat-DEVAL introduces Chain-of-Legal-Thought (CoLT), a legally-constrained reasoning mechanism that enforces sequential patent-law-specific analysis. Experiments validated by patent expert on our Pap2Pat-EvalGold dataset demonstrate that Pat-DEVAL achieves a Pearson correlation of 0.69, significantly outperforming baseline metrics and existing LLM evaluators. Notably, the…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsIntellectual Property and Patents · Law, AI, and Intellectual Property · Topic Modeling
