BitFlipScope: Scalable Fault Localization and Recovery for Bit-Flip Corruptions in LLMs
Muhammad Zeeshan Karamat, Sadman Saif, Christiana Chamon Garcia

TL;DR
BitFlipScope is a scalable framework for localizing and recovering from bit-flip faults in LLMs, enabling fault diagnosis and lightweight recovery without retraining.
Contribution
It introduces a novel software-based method for fault localization and recovery in transformer-based LLMs under various deployment scenarios.
Findings
Effective fault localization in transformer models.
Lightweight recovery without fine-tuning.
Applicable in hardware-prone and adversarial environments.
Abstract
Large Language Models (LLMs) deployed in practical and safety-critical settings are increasingly susceptible to bit-flip faults caused by hardware degradation, cosmic radiation, or deliberate fault-injection attacks such as Rowhammer. These faults silently corrupt internal parameters and can lead to unpredictable or dangerous model behavior. Localizing these corruptions is essential: without identifying the affected region, it is impossible to diagnose the source of degradation, apply targeted corrective measures, or restore model functionality without resorting to costly fine-tuning or full retraining. This work introduces BitFlipScope, a scalable, software-based framework for identifying fault-affected regions within transformer architectures under two deployment scenarios. When a clean reference model is available, BitFlipScope performs differential analysis of outputs, hidden…
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