Free space optics in two dimensions: optical elements for silicon photonics without lateral confinement
Siegfried Janz, Shurui Wang, Rubin Ma, Jean Lapointe, and Martin Vachon

TL;DR
This paper introduces a novel approach for silicon photonics using freely propagating beams manipulated by etched mirrors, eliminating the need for lateral confinement and reducing losses and sensitivity to fabrication variations.
Contribution
It demonstrates the use of total internal reflection mirrors in silicon photonics to control unconfined beams, avoiding sidewall roughness issues and enabling new optical components.
Findings
Reduced waveguide loss and back-scattering.
Wavelength independent Q factors in resonators.
Qualitative agreement with Gaussian beam theory.
Abstract
Silicon photonic components based on freely propagating beams in 220 nm thick Si slab waveguides are described and characterized. Examples include optical relays, waveguide crossings, couplers, and resonators with wavelength independent Q factors. The unconfined beams are manipulated using reflecting mirrors etched into the Si layer, which operate in the total internal reflection (TIR) regime. This approach eliminates the back-scattering and waveguide loss arising from sidewall roughness in single mode waveguides, reduces sensitivity to small dimensional variations, and reduces light induced self-heating. Although the detailed behavior of TIR at curved waveguide side wall mirror is too complex to capture by simple models, the experimental results are found to be in qualitative agreement with simple analytical calculations based on Gaussian beam theory and effective index approximations.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsPhotonic and Optical Devices · Photonic Crystals and Applications · Near-Field Optical Microscopy
