Dynamic Imaging of Periodic Structures using Extreme Ultraviolet Scatterometry
Brendan McBennett, Michael Tanksalvala, Emma E. Nelson, Theodore H. Culman, Yunhao Li, Jiayi Liu, Ethan Berk, Albert Beardo, James Harford, Justin Shaw, Henry C. Kapteyn, Margaret M. Murnane, Joshua L. Knobloch

TL;DR
This paper introduces a novel EUV scatterometry technique for real-time imaging of dynamic processes in periodic nanostructures, enabling faster analysis of nanoscale phonon and charge dynamics without full diffraction imaging.
Contribution
It presents a new method to extract 1D images of periodic structures from EUV scatterometry data by analyzing diffracted intensities, bypassing complex phase retrieval.
Findings
Method accurately reconstructs nanoscale dynamics from EUV data.
Simulations confirm robustness beyond scalar diffraction assumptions.
Experimental demonstration visualizes phonon relaxation in nanowires.
Abstract
Dynamic scattering and imaging with coherent, ultrafast, extreme ultraviolet (EUV) light sources can resolve charge, phonon and spin processes on their intrinsic length and time scales. However, full field coherent diffraction imaging requires scanning of the sample combined with computational phase retrieval, making it challenging to quickly acquire a large series of dynamic frames. In this work, we demonstrate a technique for extracting dynamic 1D images of the average unit cell in a periodic sample from traditional EUV scatterometry data by analyzing the changing intensities of the far field diffracted orders. Starting from a system of equations relating small changes in far field diffraction to phase and amplitude perturbations at the sample plane, it is shown that under certain conditions, changes to the th diffracted order map exclusively onto the th Fourier component of the…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Optical Coatings and Gratings
