The Choice of Line Lengths in Multiline Thru-Reflect-Line Calibration

TL;DR

This paper introduces a rigorous method for selecting optimal line lengths in multiline TRL calibration of VNAs, validated through high-frequency measurements and uncertainty analysis.

Contribution

It provides a nonlinear optimization approach and a simplified sparse ruler method for near-optimal line length selection in multiline TRL calibration.

Findings

Optimized line lengths improve calibration accuracy up to 150 GHz.

The methods distribute calibration uncertainty more evenly across lines.

Validated techniques on printed circuit boards with practical examples.

Abstract

This paper presents an analysis and rigorous procedure for determining the optimal lengths of line standards in multiline thru-reflect-line (TRL) calibration of vector network analyzers (VNAs). The solution is obtained through nonlinear constrained optimization of the eigenvalue problem in multiline TRL calibration. Additionally, we propose a simplified approach for near-optimal length selection based on predefined sparse rulers. Alongside the length calculation, we discuss the required number of lines to meet bandwidth requirements. The proposed methods are validated through measurements of multiple multiline TRL calibration kits on printed circuit boards of different materials and stackups, covering frequencies up to 150 GHz. A measurement-based Monte Carlo uncertainty analysis, using error boxes derived from impedance standard substrate measurements, demonstrates that the proposed line lengths distribute calibration uncertainty more evenly across lines compared to a commercial calibration kit. Practical examples are provided for various applications, including lossy and dispersive lines, as well as banded solutions for waveguides.