Charge collection efficiency of thimble ionization chambers exposed to ultra-high dose per pulse
Jos\'e Paz-Mart\'in, Andreas Sch\"uller, Marvin Apel, Araceli Gago-Arias, Juan Pardo-Montero, Faustino G\'omez

TL;DR
This study investigates the charge collection efficiency and polarity effects of thimble ionization chambers exposed to ultra-high dose per pulse, combining experimental measurements with novel simulations to improve understanding and correction methods.
Contribution
It introduces a new finite element simulation model for thimble ionization chambers and compares it with experimental data, highlighting the chambers' polarity effects at UHDP.
Findings
Thimble ICs show significant polarization effects at UHDP.
The polarity-dependent charge transport affects CCE.
Simulation results agree within 1.6% with experiments.
Abstract
Background: Commercially available ionization chambers (ICs) exposed to ultra-high dose per pulse (UHDP) exhibit deviations from a linear dose response due to volume recombination. Simulation models have been developed to describe the charge collection efficiency (CCE) but focused on parallel-plate ICs. This study aims to measure and simulate the CCE and polarity effect of thimble ICs in UHDP. Methods: The response of two PinPoint3D T31022 (PP3D) and two PinPoint T31023 (PP) ICs was investigated experimentally at the national metrology institute of Germany (PTB). The ICs were irradiated using the UHDP reference electron beam with dose per pulse up to 9.3 Gy for different voltages. A novel finite element code capable of simulating 1D and 2D geometries was developed. Results: Thimble ICs exhibit a pronounced polarization effect when irradiated with UHDP. When the sign of the collected…
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Taxonomy
TopicsRadiation Therapy and Dosimetry · Advanced Radiotherapy Techniques · Radiation Effects in Electronics
