Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES

TL;DR

This paper details the procedures for measuring and calibrating electron emission yields from various materials, using surface analysis techniques like XPS and AES, with initial data on copper and gold.

Contribution

It introduces a comprehensive methodology for producing electron emission yield datasets linked with surface composition analysis.

Findings

Emission yield datasets for copper and gold are provided.

Calibration procedures ensure data accuracy.

Surface composition influences emission yields.

Abstract

We present the measurement, characterization, and calibration procedures used to produce a series of datasets for various conductive and semiconductive materials. The data, provided, include emission yields as a function of incident electron energy together with surface composition obtained from X-Ray Photoelectron Spectroscopy or Auger Electron Spectroscopy analyses. Initial datasets cover copper and gold, with additional materials to be released on arXiv.