Moire-Engineered Ferroelectric Transistors for Nearly Trap-free, Low-Power and Non-Volatile 2D Electronics
Arup Singha, Shaili Sett, Kenji Watanabe, Takashi Taniguchi, Arindam Ghosh, and Rahul Debnath

TL;DR
This paper demonstrates a moire-engineered ferroelectric transistor using twisted WSe2 bilayers, achieving ultralow-voltage, trap-free, non-volatile, high-performance 2D electronic devices with ultrafast switching.
Contribution
It introduces a scalable, trap-free ferroelectric field-effect transistor based on moire patterns in twisted WSe2, enabling ultralow-voltage, stable, and high-speed 2D electronics.
Findings
Achieved subthreshold swing of 64 mV/decade.
Demonstrated stable non-volatile memory window of 0.10 V.
Ultrafast ferroelectric switching of ~0.5 microseconds.
Abstract
Long-range moire patterns in twisted WSe2 enable a built-in, moire-length-scale ferroelectric polarization that can be directly harnessed in electronic devices. Such a built-in ferroic landscape offers a compelling means to enable ultralow-voltage and non-volatile electronic functionality in two-dimensional materials; however, achieving stable polarization control without charge trapping has remained a persistent challenge. Here, we demonstrate a moire-engineered ferroelectric field-effect transistor (FeFET) utilizing twisted WSe2 bilayers that leverages atomically clean van der Waals interfaces to achieve efficient polarization-channel coupling and trap-suppressed, ultralow-voltage operation (subthreshold swing of 64 mV per decade). The device exhibits a stable non-volatile memory window of 0.10 V and high mobility, exceeding the performance of previously reported two-dimensional FeFET…
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Taxonomy
Topics2D Materials and Applications · Multiferroics and related materials · Ferroelectric and Negative Capacitance Devices
