Single Flux Quantum Circuit Operation at Millikelvin Temperatures

TL;DR

This study demonstrates the operation and testing of single flux quantum (SFQ) circuits at millikelvin temperatures, showing their potential for low-power quantum computing control systems.

Contribution

It provides systematic analysis of ERSFQ circuits at millikelvin temperatures, including bias margin behavior and process control monitoring, advancing cryogenic digital electronics for quantum processors.

Findings

Bias margins decrease at millikelvin temperatures.

Optimal bias current increases by ~15% at millikelvin.

Josephson junction critical current increases by ~15% when cooling from 4.2 K to millikelvin.

Abstract

As quantum computing processors increase in size, there is growing interest in developing cryogenic electronics to overcome significant challenges to system scaling. Single flux-quantum (SFQ) circuits offer a promising alternative to remote, bulky, and power-hungry room temperature electronics. To meet the need for digital qubit control, readout, and co-processing, SFQ circuits must be adapted to operate at millikelvin temperatures near quantum processors. SEEQC's SFQuClass digital quantum management approach proximally places energy-efficient SFQ (ERSFQ) circuits and qubits in a multi-chip module. This enables extremely low power dissipation, compatible with a typical dilution cryostat's limited cooling power, while maintaining high processing speed and low error rates. We report on systematic testing from 4 K to 10 mK of a comprehensive set of ERSFQ cells, as well as more complex circuits such as programmable counters and demultiplexers used in digital qubit control. We compare the operating margins and error rates of these circuits and find that, at millikelvin, bias margins decrease and the center of the margins (i.e., the optimal bias current value) increases by ~15%, compared to 4.2 K. The margins can be restored by thermal annealing by reducing Josephson junction (JJ) critical current Ic. To provide guidance for how circuit parameters vary from 4.2 K to millikelvin, relevant analog process control monitors (PCMs) were tested in the temperature range of interest. The measured JJ critical current (of the PCM JJ arrays) increases by ~15% when decreasing temperature from 4.2 K to millikelvin, in good agreement with both theory and the empirically measured change in the center of bias margins for the tested digital circuits.