Demonstration of surface-engineered oxidation-resistant Nb-Nb thermocompression bonding toward scalable superconducting quantum computing architectures
Harsh Mishra, Yusuke Kozuka, Sathish Bonam, Jun Uzuhashi, Praveenkumar Suggisetti, Tadakatsu Ohkubo, and Shiv Govind Singh

TL;DR
This paper demonstrates a surface-engineered Nb-Nb bonding method using an ultrathin gold layer to prevent oxidation, enabling scalable, low-temperature superconducting quantum device integration.
Contribution
It introduces a gold passivation technique that suppresses Nb oxidation, facilitating reliable low-temperature Nb-Nb bonding for quantum computing architectures.
Findings
Gold passivation effectively prevents Nb oxide formation.
Low-temperature bonding at 350°C achieved with high bond strength.
Enhanced bonding uniformity and superconductivity retention.
Abstract
Scalable quantum computing currently requires a large array of qubit integration, but present two-dimensional interconnects face challenges such as wiring congestion, electromagnetic interference, and limited cryogenic space. To overcome this challenge, implementing three-dimensional (3D) vertical architectures becomes crucial. Niobium (Nb), due to its excellent superconducting characteristics and strong fabrication process compatibility, stands out as a prime material choice. The main challenge in Nb-Nb bonding is the presence of an oxide layer at the interface, even after post-bonding annealing across various bonding methods. The native Nb oxide forms rapidly in air, creating a resistive barrier to supercurrent flow and introducing two-level system losses that degrade qubit coherence while increasing the overall thermal budget. These issues show the need for effective surface…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
Topics3D IC and TSV technologies · Electronic Packaging and Soldering Technologies · Copper Interconnects and Reliability
