On the Accuracy of Atomic Resolution Electrostatic Measurements in 2D Materials

TL;DR

This study evaluates how instrumental parameters affect the accuracy of atomic-resolution electrostatic measurements in 2D materials using DPC-STEM, highlighting the importance of optimized alignment for reliable results.

Contribution

It provides a systematic analysis of how probe convergence angle, defocus, and astigmatism influence measurement accuracy in atomic-resolution electrostatic mapping.

Findings

Defocus causes up to 16-30% underestimation of electrostatic fields.

Astigmatism can cause over 40% variation depending on orientation.

Optimized alignment improves measurement reliability and interpretability.

Abstract

The use of differential phase contrast (DPC) in scanning transmission electron microscopy (STEM) has shown much promise for directly investigating the functional properties of a material system, leveraging the natural coupling between the electron probe and atomic-scale electric fields to map the electrostatic configuration within a sample. However, the high sensitivity of these measurements makes them particularly vulnerable to variations in both sample properties and the configuration of the instrument, stressing the need for robust methodologies to ensure more accurate analyses. In this work, the influence of key instrumental parameters - probe convergence angle, defocus and two-fold astigmatism - on atomic-resolution segmented-detector DPC-STEM measurements is evaluated through extensive image simulations. Results show that the limit of interpretability for a 21 mrad defocused probe is found at a magnitude of 4 nm, where electrostatic field magnitude can be underestimated by about 16 % in overfocus and just above 10 % in underfocus. Equivalent results for a 30 mrad probe demonstrate underestimated values around 30 % at overfocus and 20 % for underfocus, at a lower interpretability limit of 3 nm. Two-fold astigmatism introduces orientation dependent variations that surpass 40 % for magnitudes below 3 nm, but a reduction in sensitivity to the aberration is observed when oriented along detector-segment edges. Overall, the analysis confirms the sensitivity and usefulness of the scattergram-based method and underscores the importance of optimized instrumental alignment for accurate CoM based STEM imaging.