Carrier localization and dynamics in In$_{0.10}$Ga$_{0.90}$N: the impact of alloying and Si doping
Ongeziwe Mpatani, Dominik Muth, Anton Kr\"uger, Rajdeep Adhikari, Alberta Bonanni, Marina Gerhard, Hilary Masenda

TL;DR
This study investigates how silicon doping affects carrier localization, optical properties, and defect structures in InGaN alloys, revealing that doping enhances luminescence and carrier confinement despite increasing disorder.
Contribution
It provides new insights into the effects of Si doping on disorder, localization, and optical performance in InGaN thin films, highlighting improved luminescence despite increased defect density.
Findings
Si doping increases edge dislocation density but not lattice parameters.
Doped samples show higher photoluminescence intensity and narrower linewidths.
Doping induces deeper localized states, enhancing carrier confinement.
Abstract
Alloying and doping are crucial for enhancing the electronic and optical properties of semiconductors while simultaneously introducing disorder. This report explores the effects of alloying and Si (0.5 at.\%) doping on InGaN thin films that were grown by metal-organic vapor phase epitaxy. Post-growth X-ray diffraction measurements indicate that Si doping does not affect the lattice parameters and screw dislocations but significantly increases the edge dislocation density. Temperature-dependent time-resolved photoluminescence spectroscopy shows that Si-doped InGaN exhibits higher photoluminescence intensity, blue-shifted peaks, narrower emission linewidths, and quenching of lower energy sidebands when compared to pristine InGaN. The peak energies of the most dominant feature, the donor-bound exciton, for both samples show an -shape…
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Taxonomy
TopicsGaN-based semiconductor devices and materials · Chemical and Physical Properties of Materials · Semiconductor Quantum Structures and Devices
