Imaging Quantum Well States of Dirac Electrons in Exfoliated 3D Topological Insulators
Shreyashi Sinha, Shantanu Pathak, Saswata Bhattacharya, Sujit Manna

TL;DR
This paper demonstrates a method to produce ultrathin topological insulator flakes that reveal quantum well states of Dirac electrons, enabling detailed study of their quantum confinement and electronic properties.
Contribution
It introduces a controlled exfoliation technique for high-quality 2D topological insulator layers and provides experimental evidence of quantum well states of Dirac electrons with theoretical validation.
Findings
Quantum well states of Dirac electrons are observed in exfoliated flakes.
The phase accumulation model accurately describes the quantum states.
QWS remain robust against defect scattering.
Abstract
We present a controlled mechanical exfoliation technique for bulk 3D topological insulators that yields atomically clean ultrathin flakes, enabling quantum well states (QWS) of Dirac electrons to be clearly resolved. Achieving reliable fabrication of pristine, high-quality two-dimensional layers suitable for atomic-scale spectroscopy remains a central experimental challenge in uncovering their emergent quantum states and realizing device-relevant functionalities. Atomically resolved scanning probe microscopy and micro-Raman spectroscopy reveal a strong correlation between Raman intensity and film thickness, enabling rapid identification of (Bi\textsubscript{0.1}Sb\textsubscript{0.9})\textsubscript{2}Te\textsubscript{3} flakes with desired thickness. High resolution scanning tunneling spectroscopy on exfoliated flakes with atomically flat terraces reveals QWS, driven by quantum…
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Taxonomy
TopicsTopological Materials and Phenomena · Surface and Thin Film Phenomena · Quantum and electron transport phenomena
