Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component

TL;DR

This paper explores an X-ray diffraction data processing method capable of detecting very weak reflections below background noise, enhancing phase analysis in complex multiphase materials with very low phase content.

Contribution

The paper demonstrates a data processing approach that improves detection of weak X-ray reflections, expanding the capabilities of phase analysis in multiphase materials.

Findings

Method detects reflections below noise level in X-ray data

Enables phase analysis with phases as low as 0.1 wt.%

Improves identification of multiple phases in complex samples

Abstract

The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of the background. The possibilities of the method are demonstrated on weak reflections of $\alpha$-quartz. The method of processing X-ray diffraction data makes it possible to increase the possibilities of X-ray phase analysis in determining the qualitative phase composition of multiphase materials with a small (down to $0.1$ wt. \%) content of several (up to eight) phases.