Sequential testing problem: A follow-up review
Tongu\c{c} \"Unl\"uyurt
TL;DR
This paper reviews the recent 20-year advancements in the Sequential Testing problem, highlighting new theoretical results, extensions, applications, and future research directions.
Contribution
It offers a comprehensive update on the progress of STP, summarizing key results, relationships, and proposing new research avenues.
Findings
New theoretical results on STP
Extensions of the problem and applications
Discussion of future research directions
Abstract
This review aims to provide a comprehensive update on the progress made on the Sequential Testing problem (STP) in the last 20 years after the review, [1] was published. Many studies have provided new theoretical results, extensions of the problem, and new applications. In this review, we pinpoint the main results and discuss the relations between the problems studied. We also provide possible research directions for the problem.
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Taxonomy
TopicsVLSI and Analog Circuit Testing · SARS-CoV-2 detection and testing · Engineering and Test Systems