Automated laboratory x-ray diffractometer and fluorescence spectrometer for high-throughput materials characterization
Hyun Sang Park, Timothy Long, Michael Wall, Alexander deJong, Ali Rachidi, Kacper Kowalik, Rohit Berlia, David Elbert, Timothy P. Weihs, Robert Drake, Todd C. Hufnagel

TL;DR
This paper introduces an automated, high-throughput X-ray diffractometer and fluorescence spectrometer designed for rapid, spatially-resolved materials characterization, integrating automation and AI-driven data processing.
Contribution
The paper presents a novel instrument combining simultaneous X-ray diffraction and fluorescence measurements with automation for high-throughput materials analysis.
Findings
Achieves spatial resolution of ~200 μm with 1 s exposure times.
Automated specimen handling and data processing streamline high-throughput studies.
Demonstrates rapid data collection in a Cu-Ti alloy combinatorial study.
Abstract
The increasing importance of artificial intelligence and machine learning in materials research has created demand for automated, high-throughput characterization techniques capable of rapidly generating large data sets. We describe here a new instrument for simultaneous X-ray diffraction and X-ray fluorescence spectroscopy, optimized for high-throughput studies of combinatorial specimens. A bright, focused, high-energy X-ray beam (24 keV) combined with a pixel array area detector allows spatially-resolved (~200 {\mu}m) transmission diffraction measurements through thick (100 {\mu}m) specimens of structural metals with exposure times as short as 1 s. Simultaneously, a silicon drift detector records X-ray fluorescence from the specimen for spatially-resolved measurement of composition. Specimen handling is fully automated, with a robot inside the X-ray enclosure manipulating the sample…
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Taxonomy
TopicsX-ray Spectroscopy and Fluorescence Analysis · Advanced X-ray Imaging Techniques · Machine Learning in Materials Science
