Bridging the Data Gap: Spatially Conditioned Diffusion Model for Anomaly Generation in Photovoltaic Electroluminescence Images
Shiva Hanifi, Sasan Jafarnejad, Marc K\"ontges, Andrej Wentnagel, Andreas Kokkas, Raphael Frank

TL;DR
This paper presents PV-DDPM, a novel spatially conditioned diffusion model for generating diverse PV electroluminescence images with anomalies, enhancing dataset diversity and improving anomaly detection performance.
Contribution
Introduces PV-DDPM, the first model to jointly generate multiple PV cell types with controlled anomalies, and creates an enriched dataset E-SCDD for better PV defect detection.
Findings
Generated images achieve low FID and KID scores.
Training AA-CLIP on E-SCDD improves detection metrics.
PV-DDPM enables controlled synthesis of diverse PV anomalies.
Abstract
Reliable anomaly detection in photovoltaic (PV) modules is critical for maintaining solar energy efficiency. However, developing robust computer vision models for PV inspection is constrained by the scarcity of large-scale, diverse, and balanced datasets. This study introduces PV-DDPM, a spatially conditioned denoising diffusion probabilistic model that generates anomalous electroluminescence (EL) images across four PV cell types: multi-crystalline silicon (multi-c-Si), mono-crystalline silicon (mono-c-Si), half-cut multi-c-Si, and interdigitated back contact (IBC) with dogbone interconnect. PV-DDPM enables controlled synthesis of single-defect and multi-defect scenarios by conditioning on binary masks representing structural features and defect positions. To the best of our knowledge, this is the first framework that jointly models multiple PV cell types while supporting simultaneous…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
Taxonomy
TopicsPhotovoltaic System Optimization Techniques · Photovoltaic Systems and Sustainability · Industrial Vision Systems and Defect Detection
