Decoupling Composition and Band Gap in $\kappa$-Ga$_2$O$_3$ Heterostructures via STEM-EELS
Annett Th{\o}gersen, Georg Muntingh, Lasse Vines, {\O}ystein Prytz, Max Knei{\ss}, Marius Grundmann, Holger von Wenckstern, Ingvild J. T. Jensen

TL;DR
This study uses advanced STEM-EELS techniques to precisely map and analyze band gap variations at oxide heterointerfaces, revealing strain effects dominate over composition in influencing local electronic properties.
Contribution
The paper introduces a novel automated EELS analysis framework combined with optimized STEM-EELS methods to accurately measure nanoscale band gap variations in $ppa$-Ga$_2$O$_3$ heterostructures.
Findings
Strain at defect-free interfaces causes a gradual band gap transition from 5.08 eV to 4.28 eV over 10 nm.
Structural defects relieve strain, resulting in band gaps consistent with composition.
STEM-EELS effectively resolves band gap variations at nanometer scale despite probe delocalization.
Abstract
High-resolution mapping of electronic properties at oxide heterointerfaces remains challenging due to probe delocalization and overlapping signals. In this work, we employ monochromated, probe-corrected scanning transmission electron microscopy combined with electron energy-loss spectroscopy (STEM-EELS) to resolve band gap variations across -GaO-based multilayers with nanometer-scale precision. A custom automated quantitative-based EELS analysis framework enabled automated band gap fitting and visualization, ensuring reproducibility and high spatial resolution. By optimizing acquisition parameters and quantifying inelastic delocalization, we demonstrate reliable extraction of band gap excitations from layers only a few nanometers thick. For heterostructures grown on ITO templates, strain at defect-free interfaces induces a gradual band gap transition from…
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Taxonomy
TopicsGa2O3 and related materials · Neonatal and Maternal Infections · Electronic and Structural Properties of Oxides
